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Volume 39 Issue 7
Jul.  2017
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Article Contents
ZHANG Zhen, DUAN Zhe-min, LONG Ying. Fault detection in switched current circuits based on preferred wavelet packet[J]. Chinese Journal of Engineering, 2017, 39(7): 1101-1106. doi: 10.13374/j.issn2095-9389.2017.07.017
Citation: ZHANG Zhen, DUAN Zhe-min, LONG Ying. Fault detection in switched current circuits based on preferred wavelet packet[J]. Chinese Journal of Engineering, 2017, 39(7): 1101-1106. doi: 10.13374/j.issn2095-9389.2017.07.017

Fault detection in switched current circuits based on preferred wavelet packet

doi: 10.13374/j.issn2095-9389.2017.07.017
  • Received Date: 2016-12-13
  • In order to improve the accuracy of switched current circuit fault diagnosis, a feature extraction and recognition method of switched current circuit based on wavelet packet optimization and optimization of BP neural network was proposed. Firstly, the wavelet packet decomposition of the original response signal of the switched current circuit was carried out. Then, the normalized energy value after the decomposition of the N layer was calculated, and the optimal wavelet packet basis was selected by using the characteristic deviation as the evaluation. Finally, the optimal fault feature vector was constructed. The extracted optimal fault characteristics were classified by BP neural network optimized by genetic algorithm. The results of this method were verified by the example circuit. The results show that all the soft faults are effectively classified, and the superiority of the method in the fault diagnosis of the switched current circuit is illustrated.

     

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  • [1]
    Toumazou C, Hughes J B, Battersby N C. Switched-Currents, an Analogue Technique for Digital Technology. London:Peter Peregrinus Ltd, 1993
    [3]
    Spence H. Automatic analog fault simulation//Proceedings of Auto Test Conference Test Technology and Commercialization. Dayton, 1996
    [4]
    Jantos P, Grzechca D, Rutkowski J. A global parametric faults diagnosis with the use of artificial neural networks//ECCTD 2009 European Conference on Circuit Theory and Design. Antalya, 2009:651
    [5]
    Tan Y H, Sun Y C, Yin X. Analog fault diagnosis using S-transform preprocessor and a QNN classifier. Measurement, 2013, 46(7):2174
    [6]
    Zhang A H, Chen C, Jiang B S. Analog circuit fault diagnosis based UCISVM. Neurocomputing, 2016, 173:1752
    [7]
    Aminian M, Aminian F. Neural-network based analog-circuit fault diagnosis using wavelet transform as preprocessor. IEEE Trans Circuits Syst Ⅱ:Analog Digital Signal Process, 2000, 47(2):151
    [8]
    Aminian F, Aminian M, Collins H W. Analog fault diagnosis of actual circuits using neural networks. IEEE Trans Instrum Meas, 2002, 51(3):544
    [9]
    Peng M F, Tse C K, Shen M E, et al. Fault diagnosis of analog circuits using systematic tests based on data fusion. Circuits Syst Signal Process, 2013, 32(2):525
    [10]
    Sheikhan M, Sha'bani A A. PSO-optimized modular neural network trained by OWO-HWO algorithm for fault location in analog circuits. Neural Comput Appl, 2013, 23(2):519
    [11]
    Zhao D S, He Y Z. A new test points selection method for analog fault dictionary techniques. Analog Integr Circuits Signal Process, 2015, 82(2):435
    [12]
    Jiang Y Y, Wang Y R, Luo H. Fault diagnosis of analog circuit based on a second map SVDD. Analog Integr Circuits Signal Process, 2015, 85(3):395
    [13]
    Han H, Wang H J, Tian S L, et al. A new analog circuit fault diagnosis method based on improved Mahalanobis distance. J Electron Testing, 2013, 29(1):95
    [14]
    Guo J R, He Y G, Tang S X, et al. Switched-current circuits test using pseudo-random method. Analog Integr Circuits Signal Process, 2007, 52(1):47
    [15]
    Guo J R, Cai X H, He Y G. PRBS test signature analysis of switched current circuit//20091st International Conference on Information Science and Engineering (ICISE). Nanjing, 2009:627
    [16]
    Long Y, He Y G, Liu L, et al. Implicit functional testing of switched current filter based on fault signatures. Analog Integr Circuits Signal Process, 2012, 71(2):293
    [17]
    Guo J R, He Y G, Liu M R. Wavelet neural network approach for testing of switched-current circuits. J Electr Test, 2011, 27:611
    [18]
    Long Y, He Y G, Yuan L F. Fault dictionary based switched current circuit fault diagnosis using entropy as a preprocessor. Analog Integr Circuits Signal Process, 2011, 66(1):93
    [19]
    Zhang Z, Duan Z M, Long Y, et al. A new swarm-SVM-based fault diagnosis approach for switched current circuit by using kurtosis and entropy as a preprocessor. Analog Integr Circuits Signal Process, 2014, 81(1):289
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