The Influence of Metal Plating of Chip Carrier on Reliability of SMT Solder Joints under Thermal Cycling
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摘要: 研制了一種用于SMT軟釬焊接頭熱循環可靠性試驗的熱循環發生裝置和一種SMT模擬陶瓷芯片載體,用該熱循環裝置、模擬芯片載體和統計學方法研究了芯片載體金屬化鍍層對SMT軟釬焊接頭熱循環可靠性的影響。Abstract: An experimental setup and a simulated ceramic chip carrier for study of the SMT solder joint reliability under thermal cycling have been developed. The influence of metal plating of chip carrier on the reliability of the SMT solder joints under thermal cycling has been studied statistically.
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Key words:
- SMT /
- thermal cycling /
- intermetallics /
- solder joint /
- reliability
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